Biopolis Dresden Imaging Platform

Jeol JSM 7500F (JEOL)

Image of SEM instrument

Cold field emission SEM for high resolution imaging

Booking System
Category

SEM

Location

room -1.118 (CRTD), EMF & Histo CMCB, Map

Suitable For

high resolution imaging

surface imaging of metal sputtered samples

surface imaging of unsputtered samples

Voltage

0.1-30 kV

Resolution

1 nm

Magnification

1000000 x

Gun
cold FEG
Stage

motorized

piezo-5 axis

Movements: xy, xyz, tilt

Detector

SE in lower position

Type: secondary electrons

TD

Type: direct detection

SE in lens position

Type: secondary electrons

BSE

Type: back scattered electrons
Camera

Infrared camera for sample positioning

Camera size: 1024 x 2048
Software

JEOL, TEM Center

Manufacturer
JEOL
Additional Information
  • System Manufacture ID 987654321
  • DRESDEN concept ID 1316
Touch Date
29.08.2018
Inventory Number

1234567890

Service Contact Number

+49-8161-9845-211; +49-172-888-0108

Date Of Installation
10.04.2183
End Of Warrenty
29.08.2022
Service Visits

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